Journal
IEEE MICROWAVE AND GUIDED WAVE LETTERS
Volume 10, Issue 5, Pages 183-185Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/75.850371
Keywords
dielectric films; permittivity measurement; transmission line measurements
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A method is presented to measure the dielectric properties of a thin him over a broad microwave frequency range. The parallel-plate transmission line geometry offers both the advantages of pronounced sensitivity to thin-film properties and exact computation of the value of the dielectric constant and the loss tangent. With multiline thru-reflect-line calibration techniques, the dielectric constant and loss tangent are determined to an accuracy better than 4% at 10 GHz.
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