Journal
APPLIED PHYSICS LETTERS
Volume 76, Issue 19, Pages 2713-2715Publisher
AMER INST PHYSICS
DOI: 10.1063/1.126452
Keywords
-
Categories
Ask authors/readers for more resources
X-ray reflectivity data of polymer bilayer systems have been analyzed using a Fourier method which takes into account different limits of integration in q-space. It is demonstrated that the interfacial parameters can be determined with high accuracy although the difference in the electron density (the contrast) of the two polymers is extremely small. This method is not restricted to soft-matter thin films. It can be applied to any reflectivity data from low-contrast layer systems. (C) 2000 American Institute of Physics. [S0003- 6951(00)03719-0].
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available