4.6 Article

The Meyer-Neldel rule in organic thin-film transistors

Journal

APPLIED PHYSICS LETTERS
Volume 76, Issue 23, Pages 3433-3435

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.126669

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We have measured and analyzed the temperature and gate voltage dependencies of the field-effect mobility in organic thin-film transistors. We find that the mobility prefactor increases exponentially with the activation energy in agreement with the Meyer-Neldel rule. This behavior is demonstrated in the mobility data of solution-processed pentacene, poly(2,5-thienylene vinylene) and in mobility data reported in literature. Surprisingly, the characteristic Meyer-Neldel energy for all analyzed. materials is close to 40 meV. Possible implications for the charge transport mechanism in these materials are discussed. (C) 2000 American Institute of Physics. [S0003-6951(00)02323-8].

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