Journal
PHYSICAL REVIEW LETTERS
Volume 84, Issue 25, Pages 5820-5823Publisher
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.84.5820
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We demonstrate a controlled dephasing experiment via exploiting a unique entangled interferometer-detector system, realized in an electronic mesoscopic structure. We study the dephasing process both from the path which path information available in the detector and, alternatively, from the direct effect of the detector on the interferometer. Detection is possible only due to an induced phase change in the detector. Even though this phase change cannot actually be measured, strong dephasing of the interferometer took place. The intricate role of detector's noise and coherency are investigated.
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