4.5 Article

Dephasing in semiconductor-superconductor structures by coupling to a voltage probe

Journal

SUPERLATTICES AND MICROSTRUCTURES
Volume 28, Issue 1, Pages 67-76

Publisher

ACADEMIC PRESS LTD- ELSEVIER SCIENCE LTD
DOI: 10.1006/spmi.2000.0890

Keywords

Andreev scattering; quantum interference; dephasing

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We study dephasing in semiconductor-superconductor structures caused by coupling to a voltage probe. We consider structures where the semiconductor consists of Two scattering regions between which partial dephasing is possible. As a particular example we consider a situation with a double barrier junction in the normal region. For a single-mode system we study the conductance both as a function of the position of the Fermi level and as a function of the barrier transparency. At resonance, where the double barrier is fully transparent, we study the suppression of the ideal factor-of-two enhancement of the conductance when a finite coupling to the voltage probe is taken into account. (C) 2000 Academic Press.

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