4.4 Article

Structural characterisation and homoepitaxial growth on Cu(111)

Journal

SURFACE SCIENCE
Volume 459, Issue 1-2, Pages 191-205

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/S0039-6028(00)00463-5

Keywords

atom-solid scattering and diffraction - elastic; copper; diffusion and migration; molecular beam epitaxy; surface defects; surface structure, morphology, roughness, and topography; X-ray scattering, diffraction, and reflection

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A comprehensive study of the homoepitaxial MBE growth of Cu on Cu(111) is presented. This system displays a wealth of features and a large accumulation of morphological and structural defects. It is demonstrated that all of them can be ascribed to two basic characteristics of fcc-(111) faces: the presence of two threefold adsorption sites at the surface, which allows the formation of stacking faults, and the existence of high Ehrlich-Schwoebel barriers at steps, hindering interlayer diffusion. This behaviour, therefore, must be common during growth on compact metallic faces, and could have important implications for the preparation of low-dimensional heterostructures. (C) 2000 Elsevier Science B.V. All rights reserved.

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