4.6 Article

Structure of Ti4AlN3 -: a layered Mn+1AXn nitride

Journal

MATERIALS RESEARCH BULLETIN
Volume 35, Issue 11, Pages 1785-1796

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S0025-5408(00)00383-4

Keywords

nitrides; X-ray diffraction (XRD); neutron scattering; crystal structure

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Recent high resolution transmission electron microscopy and electron probe X-ray microanalysis show that the compound originally thought to be Ti3Al2N2 is Ti4AlN3. In this paper we report on the crystal structure determination by Rietveld refinement on neutron and X-ray powder diffraction data. Ti4AlN3 crystallizes with a hexagonal unit cell, space group P6(3)/mmc, and with lattice parameters a = 2.9880(2) and c = 23.372(2) Angstrom. The stacking sequence is such that every four layers of Ti atoms is separated by a layer of Al atoms. The N atoms occupy octahedral sites between the Ti atoms making up a network of corner shared octahedra. This compound is closely related to other layered, ternary, machinable, hexagonal nitrides and carbides, namely, M2AX and M3AX2, where M is an early transition metal, A is a A-group element and X is either C and/or N. (C) 2000 Elsevier Science Ltd. All rights reserved.

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