Journal
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
Volume 61, Issue 8, Pages 1315-1320Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S0022-3697(99)00411-4
Keywords
classes; oxides; infrared spectroscopy; microstructure; optical properties
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An interferometric method was used for the determination of refractive index of glassy SiO2 in the infrared (LR) wavelength region (1.44 < lambda < 4.77 mu m) at temperatures ranging from 23.5 to 481 degrees C by IR spectroscopy. The refractive index was found to increase with temperature at a given wavelength. Irregularities of the thermal coefficient of the refractive index (dn/dT) with temperature were observed and explained by the existence of crystal-like microstructures in silica glass. Optical dispersion (dn/d lambda) exhibits a maximum at a given temperature. The wavelength at the maximum depends on temperature, showing irregularities with temperature like the thermal coefficient of refractive index. (C) 2000 Elsevier Science Ltd. All rights reserved.
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