Journal
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY
Volume 368, Issue 2-3, Pages 235-239Publisher
SPRINGER-VERLAG
DOI: 10.1007/s002160000392
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A new method for analysis of metal additives in recycled thermoplasts from electronic waste was developed, based on dissolving the samples in an organic solvent and subsequent analysis of the corresponding solutions or suspensions by total-reflection X-ray fluorescence spectroscopy (TXRF). The procedure proved to be considerably less time consuming than the conventional digestion of the polymer matrix. Additives containing Ti, Zn, Br, Cd, Sn, Sb, and Pb were analyzed in a hundred randomly selected samples from recycling, which provided an overview of the range of elemental concentrations in thermoplasts utilized for consumer electronics. The results were validated independently by instrumental neutron activation analysis (INAA), subsequent regression analysis confirmed the trueness of the chosen approach.
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