Journal
THIN SOLID FILMS
Volume 373, Issue 1-2, Pages 15-18Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/S0040-6090(00)01081-6
Keywords
cadmium telluride; reaction kinetics
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Cadmium telluride thin films have been produced using the Stacked Elemental Layer technique. The films were characterized using X-ray diffraction, optical transmittance and reflectance, and atomic force microscopy. The evolution of the thin film reaction and compound formation were studied using X-ray data. The results show that the growth is diffusion controlled and the activation energy is 81.8 kJ/mol. In addition, some physical properties of the films produced are reported. (C) 2000 Elsevier Science S.A. All rights reserved.
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