Journal
APPLIED PHYSICS LETTERS
Volume 77, Issue 10, Pages 1520-1522Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1290691
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In an attempt to reproduce the functional properties associated with relaxor electroceramics, pulsed laser deposition has been used to fabricate thin-film capacitor structures in which the dielectric layer is composed of a superlattice of Ba0.8Sr0.2TiO3 and Ba0.2Sr0.8TiO3. The properties of the capacitors were investigated as a function of superlattice periodicity. The dielectric constant was significantly enhanced at stacking periodicities of a few unit cells, consistent with relaxor behavior. However, enhancement in dielectric constant was generally associated with high dielectric loss. Analysis of the imaginary permittivity as a function of frequency shows that fine-scale superlattices conform to Maxwell-Wagner behavior. This suggests that the observed enhancement of the real part of the dielectric constant is an artifact produced by carrier migration to interfaces within the dielectric. A comparison of this data with that already published on dielectric superlattices suggests that previous claims of an enhancement in dielectric constant may also be attributed to the Maxwell-Wagner effect. (C) 2000 American Institute of Physics. [S0003-6951(00)01136-0].
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