Journal
APPLIED PHYSICS LETTERS
Volume 77, Issue 13, Pages 2048-2050Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1311950
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The temperature dependence of the local ferroelectric polarization of BaxSr1-xTiO3 thin films is measured with submicrometer resolution using confocal scanning optical microscopy. The local ferroelectric hysteresis loop changes shape and disappears as the temperature is increased over a narrow range of temperatures (Delta T similar to 10 K). The local Curie temperature T-C(x,y) varies significantly with position, and the distribution of T-C is consistent with the broad temperature dependence of the dielectric permittivity measured through conventional methods. These results directly confirm the hypothesis that the ferroelectric phase transition in these materials is inhomogeneously broadened. (C) 2000 American Institute of Physics. [S0003- 6951(00)00539-8].
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