Neel orange-peel coupling in magnetic tunneling junction devices

We present measurements of the magnitude of Neel orange-peel coupling due to interface roughness in a series of magnetic tunneling junction devices. Results from magnetometry and transport measurements are shown to be in good agreement with the theoretical model of Neel. In addition, we have used transmission electron microscopy to directly probe the sample interface roughness and obtain results consistent with the values obtained by magnetometry and transport methods. (C) 2000 American Institute of Physics. [S0003-6951(00)00541-6].