Journal
OPTICS LETTERS
Volume 25, Issue 20, Pages 1526-1528Publisher
OPTICAL SOC AMER
DOI: 10.1364/OL.25.001526
Keywords
-
Categories
Ask authors/readers for more resources
We describe a new scanning microscopy technique, phase-dispersion microscopy (PDM). The technique is based on measuring the phase difference between the fundamental and the second-harmonic light in a novel interferometer. PDM is highly sensitive to subtle refractive-index differences that are due to dispersion (differential optical path sensitivity, 5 nm). We apply PDM to measure minute amounts of DNA in solution and to study biological tissue sections. We demonstrate that PDM performs better than conventional phase-contrast microscopy in imaging dispersive and weakly scattering samples. (C) 2000 Optical Society of America OCIS codes: 040.2840, 110.0180, 110.4500, 120.5050, 170.3880.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available