Journal
SURFACE SCIENCE
Volume 465, Issue 3, Pages L777-L782Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S0039-6028(00)00784-6
Keywords
copper; epitaxy; lead; low energy electron diffraction (LEED); low-energy electron microscopy (LEEM); low index single crystal surfaces; surface structure; morphology; roughness; and topography
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We use low-energy electron microscopy to identify a correlation between the growth shape of three-dimensional Pb islands on Cu(100) and the domain structure of the underlying Pb overlayer. Deposition of 0.6 monolayer Pb on Cu(100) produces a compressed c(2 x 2) overlayer, designated c(5 root2 x root2)R45, with periodic rows of anti-phase boundaries. We find that heating the surface to temperatures above 100 degreesC coarsens the orientational domains of this structure to sizes that are easily resolved in the low-energy electron microscope. Three-dimensional Pb islands, grown on the coarsened domains, are found to be asymmetric with orientations that correlate with the domain structure. Once nucleated with a preferred growth orientation, islands continue to grow with the same preferred orientation, even across domain boundaries. (C) 2000 Elsevier Science B.V. All rights reserved.
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