Journal
INORGANIC MATERIALS
Volume 36, Issue 11, Pages 1108-1113Publisher
MAIK NAUKA/INTERPERIODICA/SPRINGER
DOI: 10.1007/BF02758926
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The structures of the Ge3Bi6Te10, GeBi6Te10, and Ge2Bi10Te17 compounds, belonging to the nGeTe . mBi(2)Te(3) homologous series, were studied by x-ray diffraction, For Ge3Bi2Te6, the atomic coordinates, lattice parameters, and interatomic distances were determined. This compound was shown to contain mixed (Ge + Bi) cation layers. The c parameters of the hexagonal cells of GeBi6Te10 and Ge2Bi10Te17 were determined. It is shown that the x-ray patterns from the cleaved surfaces of single-crystal nGeTe . mBi(2)Te(3) compounds vary in a systematic manner with increasing nlm ratio, which is attributable to the filling of empty Te octahedra. For 00l reflections, index I can be expressed in general form through n and m.
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