Journal
APPLIED PHYSICS LETTERS
Volume 77, Issue 21, Pages 3426-3428Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1326847
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We propose a method of rapid construction of a structural-magnetic-electronic phase diagram of doped Mott insulators. The composition-spread method is utilized for fabricating a film whose doping concentration varies from 0 to 1 continuously. The concurrent x-ray diffractometer that measures x-ray diffraction spectra of all the composition simultaneously, the scanning superconducting quantum interference device microscope, and the infrared optical spectroscopy are employed for characterizing the film. A demonstration is given for a colossal magnetoresistive material, La1-xSrxMnO3. (C) 2000 American Institute of Physics. [S0003-6951(00)01247-X].
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