Journal
MATERIALS LETTERS
Volume 46, Issue 6, Pages 327-331Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S0167-577X(00)00196-8
Keywords
germanium-sulfer-bismuth glasses; X-ray photoelectron spectroscopy
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X-ray photoelectron spectroscopy measurements have been performed on n-type Bi-modified Ge20S64Bi16 glass. The observed chemical shifts show that Bi is incorporated as a positive charged center into the matrix of Ge20S80 parent glass. (C) 2000 Elsevier Science B.V. An rights reserved.
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