Orientated growth of V2O5 electrochromic thin films on transparent conductive glass by pulsed excimer laser ablation technique

Highly c-axis orientated growth nano-crystalline V2O5 films were successfully synthesized on In2O3:SnO2 glass by using the laser ablation technique at deposition temperatures as low as 200 degreesC. The structural properties of as-deposited and annealed VOx thin films were analysed using the scanning accessory of a transmission electron microscope, x-ray diffraction, Fourier transform infrared spectrum and Raman spectrum. Cyclic voltammograms showed no long-term degradation, at least up to 8000 cycles, and durability was verified to 60 000 cycles in the voltage range between -1.2 and 1.4 V. In situ spectroelectrochemical measurements were carried out. The optical spectra of V2O5 thin films, as-prepared (deposited at 200 degreesC) and after 60 000 cycles, showed a significant change of the optical density in the visible range. It is demonstrated that these V2O5 thin films are good candidates for cathode materials in rechargeable batteries and electrochromic devices.