Local-structure analysis around dopant atoms using multiple energy x-ray holography

We used multiple energy x-ray holography (MEXH) to image the local atomic environment of Zn atoms doped in a GaAs wafer using synchrotron radiation and a multielement solid-state detector. The obtained atomic images revealed that the Zn atoms occupied substitutional site. By the comparison of the reconstructed images 1.41 Angstrom above and below the emitter atom, the suppression of twin images due to MEXH was confirmed experimentally for certain atoms.