Simultaneous observation of millisecond dynamics in atomistic structure, force and conductance on the basis of transmission electron microscopy

High-resolution transmission electron microscopy (HRTEM) has been developed to possess functions of atomic force microscopy and scanning tunneling microscopy. Dynamics of subnano Newton-scale force and conductance were simultaneously observed at intervals of 1/30-1/3840 s during HRTEM imaging of contact, deformation and fracture processes between nanometer-sized tips. The experimental basis of the atomic-scale mechanics of materials was developed on the basis of the present microscopy.