Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 114, Issue -, Pages 569-574Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S0368-2048(00)00251-6
Keywords
electron-energy-loss spectroscopy; thin organic film growth; vibrational spectra; multiple scattering analysis
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Vibrational high-resolution electron-energy-loss spectra of solid multilayer films of benzene and SF6 have been analysed in terms of multiple scattering contributions and dependence of the band intensities on the film thickness. The analysis shows that valuable information can be extracted from multiple scattering processes even if the spectral pattern is more complex than in simple hydrocarbon compounds, i.e. when the highest energy fundamental vibration lies close to the other fundamental bands and is excited via dipole scattering. It is also shown that the different dependence of dipole and impact scattering on the film thickness can be exploited to monitor subsequent stages of multilayer film growth. (C) 2001 Elsevier Science B.V. All rights reserved.
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