Journal
THIN SOLID FILMS
Volume 384, Issue 1, Pages 58-64Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/S0040-6090(00)01820-4
Keywords
vanadium pentoxide; optical properties; spectroscopic ellipsometry; nanostructure
Ask authors/readers for more resources
In this paper, a spectroscopic ellipsometry (SE) study was carried out on V2O5 nanocrystalline thin films grown by plasma enhanced chemical vapor deposition. Both the real and imaginary part of the complex dielectric function and, hence, the refractive index and absorption coefficients, were described up to a photon energy of 5 eV, taking into account the anisotropy of vanadium pentoxide and the influence of the films microstructure on the optical properties. A novel approach based on a suitable combination of Lorentzian oscillators was used to describe the V2O5 optical properties. The effect of experimental parameters, such as deposition temperature and substrate, on the film microstructure and optical properties was investigated. (C) 2001 Elsevier Science B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available