Dielectric properties of Ba(Zr,Ti)O3-based ferroelectrics for capacitor applications

The purpose of the present investigation is to describe the influence of the processing parameters on the dielectric behavior of manganese-doped Ba(Ti1-xZrx)O-3 ceramics, particularly variations in the small-signal aging rate, temperature characteristic, and hysteresis. In this paper, the aging behavior of base-metal electrode materials above the temperature of the permittivity maximum (T-M), including the influence of the zirconium content and annealing conditions, is described for the first time. The aging rate at temperatures greater than T-M decreases as the oxygen partial pressure increases during annealing and the zirconium content increases, whereas the aging rate exhibits a maximum at temperatures much less than T-M. The behavior is explained in terms of a diffuse phase transition, Hysteresis-loop deformation is observed during aging.