Journal
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume 50, Issue 2, Pages 445-448Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/19.918162
Keywords
noise measurements; spectral analysis; time domain analysis; voltmeters; white noise
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When analyzing nanovoltmeter measurements, stochastic serial correlations are often ignored and the experimental standard deviation of the mean is assumed to be the experimental standard deviation of a single observation divided by the square root of the number of observations, This is justified only for white noise. This paper demonstrates the use of the power spectrum and the Allan variance to analyze data, identify the regimes of white noise, and characterize the performance of digital and analog de nanovoltmeters. Limits imposed by temperature variations, 1/f noise and source resistance are investigated.
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