Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 72, Issue 5, Pages 2322-2324Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1351840
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The combination of magnetic circular dichroism as a magnetic contrast mechanism and a transmission x-ray microscope allows imaging of magnetic structures with lateral resolutions down to 25 nm. Results on magneto-optical Tb-25(Fe75Co25)(75) layers system with thermomagnetically written bits of various sizes were obtained at the x-ray microscope XM-1 at the Advanced Light Source in Berkeley, CA. The results prove the thermal stability of the bits in the recording process. Furthermore the capability of soft x-ray microscopy with respect to the achievable lateral resolution, element specificity and sensitivity to thin magnetic layers is demonstrated. The potential of imaging in applied magnetic fields for both out-of-plane and in-plane magnetized thin magnetic films is outlined. (C) 2001 American Institute of Physics.
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