4.6 Article

Fundamentals and model of photonic-force microscopy

Journal

OPTICS LETTERS
Volume 26, Issue 10, Pages 707-709

Publisher

OPTICAL SOC AMER
DOI: 10.1364/OL.26.000707

Keywords

-

Categories

Ask authors/readers for more resources

Exact calculations of the near-field electromagnetic force on a nanoparticle exerted by the presence of a corrugated dielectric interface are carried out. The illumination of this system excites the particle eigenmodes. The calculation is two-dimensional, so the nanoparticle is actually a nanocylinder that scans parallel to the interface. This system constitutes a model of force transduction and surface topography imaging for a photonic-force microscope with signal enhancement owing to morphological resonance excitation of the probe. (C) 2001 Optical Society of America.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available