Journal
APPLIED SURFACE SCIENCE
Volume 175, Issue -, Pages 332-336Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S0169-4332(01)00082-4
Keywords
surface X-ray diffraction; surface crystallography; organic thin films; epitaxy
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The structure and epitaxy of thin films of PTCDA (3,4,9,10-perylenetetracarboxylic dianhydride, C24H8O6) grown at 180 degreesC on Ag(1 1 1) have been studied in situ using grazing-incidence X-ray diffraction. An extensive map of Bragg reflections has been recorded. A pronounced peak splitting is found, which provides evidence for the coexistence of alpha and beta -like polymorphs, (C) 2001 Elsevier Science B.V. All rights reserved.
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