Journal
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN
Volume 70, Issue 6, Pages 1813-1816Publisher
PHYSICAL SOC JAPAN
DOI: 10.1143/JPSJ.70.1813
Keywords
resonant soft X-ray emission spectroscopy; d-d excitation; charge-transfer excitation; transition metal; NiO; Raman
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We study the electronic structure of NiO using resonant soft X-ray emission spectroscopy across the Ni L-2.3 thresholds. We observe inelastic (Raman) features within 10eV of the elastic peak energy. At the L-3 resonance, the features within 4eV are enhanced and can be directly assigned to the d-d multiplets of NiO, in correspondence to features observed in optical absorption spectra. Resonance enhancements of the triplet and singlet states resolved in energy confirm a spin-flip transition. Charge-transfer (CT) excitations are also clearly identified by resonance enhancement at photon energies corresponding to the satellites observed in the Ni L-2,L-3 X-ray absorption spectra.
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