Journal
PHYSICAL REVIEW LETTERS
Volume 86, Issue 23, Pages 5389-5392Publisher
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.86.5389
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The magnetic anisotropy in antiferromagnetic 500 Angstrom thick NiO films, before and after the establishment of an exchange bias field with Co84Fe16 ferromagnetic layers, was measured using magnetic linear dichroism in soft x-ray absorption. Both < 111 > textured NiO and untextured NiO films show exchange-bias induced in-plane magnetic anisotropy of nearly equal magnitude and with the Ni moment axis being nearly parallel to the exchange bias field direction. These results represent the first observation of the key step in the exchange biasing process, namely, repopulation of the antiferromagnetic domains whose magnetization axis is closest to the exchange bias field direction.
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