☆ 4.7 Article

A methodology for grain boundary plane assessment by single-section trace analysis

SCRIPTA MATERIALIA (2001)

Journal

SCRIPTA MATERIALIA

Volume 44, Issue 12, Pages 2789-2794

Publisher

PERGAMON-ELSEVIER SCIENCE LTD

DOI: 10.1016/S1359-6462(01)00975-7

Keywords

scanning electron microscopy; grain boundaries; electron diffraction; microstructure

Categories

Nanoscience & Nanotechnology Materials Science, Multidisciplinary Metallurgy & Metallurgical Engineering

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