Highly simplified device for ultrashort-pulse measurement

We show that a frequency-resolved optical gating device using (1) a thick nonlinear crystal to replace the usual thin crystal and spectrometer and (2) a Fresnel biprism to replace the beam splitter and delay line yields a remarkably simple single-shot ultrashort-pulse intensity-and-phase measurement device with no sensitive alignment parameters and significantly greater sensitivity. (C) 2001 Optical Society of America