4.7 Article Proceedings Paper

Deposition rate and three-dimensional uniformity of RF plasma deposited SiOx films

Journal

SURFACE & COATINGS TECHNOLOGY
Volume 142, Issue -, Pages 849-855

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/S0257-8972(01)01100-8

Keywords

HMDSO; SiOx films; RF plasma; deposition rate; uniform coating

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The variation of power, pressure and O-2/HMDSO ratio in an RF plasma was carried out to examine deposition rates and to optimize SiOx film properties for the coating of polymers. The deposition rate can mainly be increased with monomer gas flow, whereas it is independent of pressure. Pure HMDSO plasmas reveal different internal conditions and deposition rates compared to gas mixtures of O-2 and HMDSO. Empirically obtained deposition models for the used symmetrical plasma reactor are given. Investigations on the three-dimensional (3D) uniformity of quartz-like coatings on polycarbonate blocks with and without recesses were performed. The deposition rate depends on the dimensions of the 3D-formed parts when depositing in front of the RF electrode. A higher pressure and use of power modulation can improve the coating uniformity in fissures. (C) 2001 Elsevier Science BN. All rights reserved.

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