Journal
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
Volume 309, Issue -, Pages 28-31Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/S0921-5093(00)01687-7
Keywords
ultra-small-angle x-ray scattering; USAXS imaging; plastic deformation; dislocation structures
Ask authors/readers for more resources
New ultra-small-angle X-ray scattering (USAXS) facilities at third generation synchrotron sources enjoy an additional one to three decades of X-ray brilliance over second generation instruments, and can now quantify microstructural features from 3 nm to 1.3 mum in size. These developments offer exciting possibilities for further exploration of dislocation and other deformation microstructures. To the portfolio of existing techniques we now add a promising experimental window, USAXS imaging, in which high angular resolution images are acquired at scattering vectors related to the observed microstructures. Early results from this ultra-sensitive technique indicate that the arrangements of creep cavities in mildly deformed polycrystalline copper can be observed on many length scales, and the results can be compared with the size distributions derived from a USAXS analysis. Many of the features observed in USAXS imaging are not seen using other existing experimental techniques. Published by Elsevier Science B.V.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available