Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Volume 467, Issue -, Pages 1274-1278Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S0168-9002(01)00632-5
Keywords
deep X-ray lithography; beam-stop
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A Deep X-Ray Lithography (DXRL) beamline was just commissioned at ELETTRA in Trieste, the Italian third generation synchrotron light source whose features make it well adapted to the DXRL process. A general description of the beamline is given with an emphasis on the reduction of the effect of secondary emission using a high energy filter based on an horizontal beam-stop. Finally the first fabricated microstructures are presented. (C) 2001 Elsevier Science B.V. All rights reserved.
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