Journal
JOURNAL OF MATERIALS RESEARCH
Volume 16, Issue 9, Pages 2739-2751Publisher
CAMBRIDGE UNIV PRESS
DOI: 10.1557/JMR.2001.0374
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A detailed impedance analysis using the brick-layer model is performed on a high-purity yttria-stabilized tetragonal zirconia polycrystal (Y-TZP). Space-charge impedance is generally formulated and expressions for the respective space-charge models are therefrom derived depending on whether dopant ions are mobile or immobile. Pronounced yttrium segregation in Y-TZP is also considered in the analysis in that the dopant profile is assumed to be frozen from a high-temperature equilibrium distribution. Comparison with experimental observations shows that the electrically measured grain-boundary thickness corresponds to the Schottky-barrier width, slightly modified by the dopant segregation. The grain-boundary resistance is not consistent with any space-charge models and the strong defect interaction due to the yttrium enrichment is suggested to be mainly responsible.
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