Some structural studies on successive ionic layer adsorption and reaction (SILAR)-deposited US thin films

Cadmium sulfide thin films have been deposited by a simple and inexpensive successive ionic layer adsorption and reaction (SILAR) method from aqueous as well as non-aqueous media. The CdS films have been characterized by X-ray diffraction (XRD), scanning electron microcopy (SEM), transmission electron microscopy (TEM), energy dispersive X-ray analyses (EDAX) and Rutherford back scattering (RBS). X-ray studies showed the hexagonal crystal structure of US films. The surface morphology is found to be smooth and dense from SEM images for both the films. High resolution TEM (HRTEM) showed that the films consist of nanoparticles. The EDAX and RBS studies showed stoichiornetric formation of US from both the media. Inclusion of oxygen is observed from RBS studies. (C) 2001 Elsevier Science B.V. All rights reserved.