4.5 Article

Microstructure coarsening during static annealing of 60Sn4OPb solder joints: II eutectic coarsening kinetics

Journal

JOURNAL OF ELECTRONIC MATERIALS
Volume 30, Issue 10, Pages 1303-1307

Publisher

MINERALS METALS MATERIALS SOC
DOI: 10.1007/s11664-001-0115-y

Keywords

phase coarsening kinetics; activation energy; grain boundary diffusion

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The eutectic coarsening kinetics for 60Sn40Pb solder joints annealed at 50 degreesC to 150 degreesC was determined to be of the form (D) over bar (n)-(D) over bar (n)(o) = K-0 exp (-Q/RT)t where (D) over bar is the mean linear intercept phase size, (d) over bar (o) approximate to 1.0 mum the as-reflowed phase size, n = 4.1 +/-0.15, Q = 39.8 +/-0.8 kJ/mole, K-o = 1x10(-23) -4.5x10(-23) m(4)/s, and t the time. The magnitude of the phase size exponent, n, and the parameters, K-o, and Q, are in accord with the models by Senkov and Myshlyaev and by Ardell for phase coarsening controlled by grain boundary or interfacial solute diffusion. The phase shape factor did not have a significant influence on the coarsening kinetics.

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