Journal
PHYSICAL REVIEW LETTERS
Volume 87, Issue 14, Pages -Publisher
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.87.140801
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The transverse coherence of x rays was-measured with an intensity interferometer using a 120-mu eV-bandwidth monochromator operating at 14.41 keV. By analyzing the transverse coherence profiles, a vertical source profile of a 25-m long undulator of SPring-8, as wen as the coherence degradation by a phase object in the beam path, were quantitatively characterized.
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