Journal
JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Volume 106, Issue 6, Pages 997-1012Publisher
US GOVERNMENT PRINTING OFFICE
DOI: 10.6028/jres.106.051
Keywords
crystal structure; crystallography; defects; electron diffraction; phase transitions; quasicrystals; transmission electron microscopy
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Electron diffraction via the transmission electron microscope is a powerful method for characterizing the structure of materials, including perfect crystals and defect structures. The advantages of electron diffraction over other methods, e. g., x-ray or neutron, arise from the extremely short wavelength ( approximate to2 pm), the strong atomic scattering, and the ability to examine tiny volumes of matter ( approximate to nm(3)). The NIST Materials Science and Engineering Laboratory has a history of discovery and characterization of new structures through electron diffraction, alone or in combination with other diffraction methods. This paper provides a survey of some of this work enabled through electron microscopy.
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