Journal
APPLIED PHYSICS LETTERS
Volume 79, Issue 19, Pages 3176-3178Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1416478
Keywords
-
Categories
Ask authors/readers for more resources
Activated reactive evaporation has been used to grow copper oxide nanoparticles in the size range of 8-100 nm. X-ray diffraction spectra clearly show the presence of a single Cu2O phase. Detailed x-ray photoelectron spectroscopy studies show an increase in the ionicity of the Cu2O system with decreasing particle size. Depth profiling and finger printing of x-ray photoelectron spectra reveal that the Cu2O nanoparticles are capped with a CuO surface layer of thickness approximate to1.6 nm. This study strongly suggests that the stabilization of the cubic Cu2O nanophase is enhanced by the formation of a CuO surface layer. (C) 2001 American Institute of Physics.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available