Laboratory and synchrotron radiation total-reflection X-ray fluorescence: new perspectives in detection limits and data analysis

Having established detection limits for transition elements exceeding current requirements of the semiconductor industry, our recent efforts at the Stanford Synchrotron Radiation Laboratory (SSRL) have focused on the improvement of the detection sensitivity for light elements such as Al. Data analysis is particularly challenging for Al, due to the presence of the neighboring Si signal from the substrate. Detection limits can be significantly improved by tuning the excitation energy below the Si-K absorption edge. For conventional TXRF systems this can be done by using a W-M alpha fluorescence line (1.78 keV) for excitation. At a synchrotron radiation facility energy tunability is available. However, in both cases this results in a substantial increase in background due to resonant X-ray Raman scattering. This scattering dominates the background under the Al K alpha fluorescence line, and consequently limits the achievable sensitivity for the detection of Al surface contaminants. In particular, we find that for a precise determination of the achievable sensitivity, the specific shape of the continuous Raman background must be taken into account in the data analysis. The data deconvolution presented here opens a new perspective for conventional TXRF systems to mitigate this background limitation. This results in a minimum detection limit of 2.4 X 10(9) atoms/cm(2) for Al. Based on these results it will also be demonstrated that by improving the detector resolution, the minimum detection limit can be improved significantly. For a detector resolution of 15 eV as predicted for novel superconducting tunnel junction detectors, an improvement in minimum detection limit of approximately a factor of 3 can be estimated. (C) 2001 Elsevier Science B.V. All rights reserved.