Journal
APPLIED PHYSICS LETTERS
Volume 80, Issue 1, Pages 97-99Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1428413
Keywords
-
Categories
Ask authors/readers for more resources
In this letter, we report on the integration of epitaxial ferroelectric Pb(Zr, Ti)O-3 (PZT) thin films on Si [100] substrates using a SrTiO3 (STO) template layer and a conducting perovskite (La0.5Sr0.5)CoO3 electrode. X-ray diffraction studies reveal both in-plane and out-of-plane alignment of the heterostructure. The epitaxial films show extremely high remnant polarization as well as piezoelectric d(33) coefficients compared to textured and untextured polycrystalline films. (C) 2002 American Institute of Physics.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available