Journal
SURFACE SCIENCE
Volume 499, Issue 1, Pages L141-L147Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S0039-6028(01)01757-5
Keywords
polycrystalline surfaces; surface structure, morphology, roughness and topography; synchrotron radiation photoelectron spectroscopy
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Experimental resonant photoemission (ResPes) results for alpha-Pu and delta-Pu bulk samples are presented and compared to the results of an atomic model calculation. Both Pu samples exhibit limited agreement with the atomic model calculations. As expected, alpha-Pu appears to have more 5f valence band delocalization than delta-Pu. Evidence of an enhanced sensitivity to surface corruption, by using synchrotron radiation as the excitation., is presented. (C) 2001 Elsevier Science B.V. All rights reserved.
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