Journal
PHYSICAL REVIEW B
Volume 65, Issue 12, Pages -Publisher
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevB.65.125417
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The tip-sample interaction and scanning tunneling microscopy atomic-force microscopy (STM-AFM) image formation on TiO2(110) 1x1 and 1x2 surfaces are simulated by using the ultrasoft pseudopotentials plane-wave technique. The effects of spin polarization and bias voltage on the tip-sample interaction in AFM are also investigated. The calculation demonstrates that overall the tip-oxygen interaction is much stronger than the tip-Ti interaction, which determines the main feature of the AFM image formation. The present calculations provide reasonable explanations to a very recent experiment adopting the technique of the combination of STM and AFM.
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