4.5 Article

Microstructural characterization of damage in thermomechanically fatigued Sn-Ag based solder joints

Journal

JOURNAL OF ELECTRONIC MATERIALS
Volume 31, Issue 4, Pages 292-297

Publisher

SPRINGER
DOI: 10.1007/s11664-002-0146-z

Keywords

thermomechanical fatigue; lead-free solder; eutectic Sn-Ag solder; damage characterization

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Sn-Ag based solder joints of 100-mum thickness were thermomechanically fatigued between -15degreesC and +150degreesC with a ramp rate of 25degreesC/min for the heating segment and 7degreesC/min for the cooling segment. The hold times were 20 min at high temperature extreme and 300 min at the low temperature extreme. Surface damage accumulation predominantly consisted of shear banding, surface relief due to Sn-grain extrusion, grain boundary sliding, and grain decohesion usually near the solder/substrate interface. Small alloy additions were found to affect the extent of this surface damage accumulation.

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