The merits of particle induced X-ray emission in revealing painting techniques

Particle induced X-ray emission (PIXE) at the external proton beam has proved ideal to study individual techniques of creating art objects. In particular, PIXE is suitable for examining paintings because of the low level of background produced by organic components like binders and paper backings. Thus, traces of pigments as deposited from pens on cardboard can be identified by this method. The combination of PIXE with external Rutherford backscattering spectrometry (RBS) allows non-destructive characterisation of near surface and thin film arrangements of paint materials. Thicker but less complex layers of oil paintings can be identified by special procedures of depth-resolved PIXE investigation. In this case, RBS provides additional information on organic coverings like madder lake or varnishes. (C) 2002 Elsevier Science B.V. All rights reserved.