Journal
JOURNAL OF CHEMICAL PHYSICS
Volume 116, Issue 13, Pages 5801-5806Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1456035
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We examined the influence of film thickness and composition on the effective T-g of compatible thin film mixtures of polystyrene (PS) and tetramethylbisphenol-A polycarbonate (TMPC) on SiOx/Si substrates using spectroscopic ellipsometry. Our measurements reveal that while the T-g of TMPC films increased with decreasing film thickness, h, the effective T-g of thin film mixtures of PS and TMPC decreased with decreasing film thickness. In these mixtures, T-g was independent of film thickness at large h. We also found that while the T-g of bulk mixtures of TMPC/PS exhibited large negative deviations from additivity with composition, such deviations were negligible in the thin film mixtures. The thickness dependence of T-g is compared with theory. (C) 2002 American Institute of Physics.
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