4.6 Article

SiC power Schottky and PiN diodes

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 49, Issue 4, Pages 665-672

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/16.992877

Keywords

diode; leakage; on-resistance; PiN; rectifiers; reverse recovery; Schottky; SiC

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The present state of SiC power Schottky and PiN diodes are presented in this paper. The design, fabrication, and characterization of a 130 A Schottky diode, 4.9 kV Schottky diode, and an 8.6 kV 4H-SiC PiN diode, which are considered to be significant milestones in the development of high power SiC diodes, are described in detail. Design guidelines and practical issues for the realization of high-power SiC Schottky and PiN diodes are also presented. Experimental results on edge termination techniques applied to newly developed, extremely thick (e.g., 85 and 100 mum) 4H-SiC epitaxial layers show promising results. Switching and high-temperature measurements prove that SiC power diodes offer extremely low loss alternatives to conventional technologies and show the promise of demonstrating efficient power circuits. At sufficiently high on-state current densities, the on-state voltage drop of Schottky and PiN diodes have been shown to be comparable to those offered by conventional technologies.

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