4.0 Article

Rietveld analysis of X-ray diffraction pattern from β-Ta2O5 oxide

Journal

CRYSTALLOGRAPHY REPORTS
Volume 47, Issue 3, Pages 415-419

Publisher

MAIK NAUKA/INTERPERIODICA PUBL
DOI: 10.1134/1.1481927

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The structure of low-temperature beta-Ta2O5 oxide has been studied by the method of Rietveld full-profile analysis. It is established that this oxide has an orthorhombic structure with lattice parameters a = 6.217 Angstrom, b = 3.677 Angstrom, and c = 7.794 Angstrom. The atomic coordinates and thermal parameters are also determined. (C) 2002 MAIK Nauka/Interperiodica.

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